Title : Probabilistic Design for Reliability Concept in Electronics and Photonics Materials Science: Role, Significance, Attributes, Challenges
The probabilistic design for reliability (PDfR) concept in electronics and photonics (EP) materials science and engineering is addressed. It is based on 1) highly focused and highly cost-effective failure oriented accelerated testing (FOAT), aimed at understanding the physics of the anticipated failures and at quantifying, on the probabilistic basis, the outcome of FOAT conducted for the most vulnerable element(s) of the product of interest considering its most likely applications and the most meaningful combination of possible stressors (stimuli); and on 2) simple and physically meaningful predictive models (PM), both analytical and computer-aided, such as, e.g., multi-parametric Boltzmann-Arrhenius-Zhurkov (BAZ) equation, aimed at bridging the gap between the FOAT data and the most likely field conditions. The PDfR concept proceeds from the recognition of the fact that nothing is perfect and that the difference between a highly reliable and an insufficiently reliable product is “merely” in the level of the never-zero probabilities of their failure.
What will audience learn from your presentation?
- Learn how to use analytical ("mathematical") modeling, in addition to computer-aided evaluations, in the design-for-reliability of electronic and photonic systems
- Understand the incentive for applying a probabilistic approach in the electronic and photonic materials science and engineering
- Be able to organize and conduct, when developing a new electronic or a photonic technology, highly focused and highly cost effective failure oriented accelerated testing (FOAT)
- Learn, using the Boltzmann-Arrhenius-Zhurkov (BAZ) constitutive equation, how to predict the probability of failure in the field from the FOAT data