HYBRID EVENT: You can participate in person at Baltimore, Maryland, USA or Virtually from your home or work.
Ephraim Suhir, Speaker at Materials Science Conferences
Portland State University, United States
Title : Probabilistic design for reliability concept in electronics and photonics materials science: role, significance, attributes, challenges

Abstract:

The probabilistic design for reliability (PDfR) concept in electronics and photonics (EP) materials science and engineering is addressed. It is based on  1) highly focused and highly cost-effective failure oriented accelerated testing (FOAT),  aimed at understanding the physics of the anticipated failures and at quantifying, on the probabilistic basis, the outcome of  FOAT conducted for the most vulnerable element(s) of the product of interest considering its most likely applications and the most meaningful combination of possible stressors (stimuli); and on 2) simple and physically meaningful predictive models (PM), both analytical and computer-aided, such as, e.g., multi-parametric Boltzmann-Arrhenius-Zhurkov (BAZ) equation, aimed at bridging the gap between the FOAT data and the most likely  field conditions. The PDfR concept proceeds from the recognition of the fact that nothing is perfect and that the difference between a highly reliable and an insufficiently reliable product is “merely” in the level of the never-zero probabilities of their failure.

Audience Take Away Notes:

  • Learn how to use analytical ("mathematical") modeling, in addition to computer-aided evaluations, in the design-for-reliability of electronic and photonic systems
  • Understand the incentive for applying a probabilistic approach in the electronic and photonic materials science and engineering
  • Be able to organize and conduct, when developing a new electronic or a photonic technology, highly focused and highly cost effective failure oriented accelerated testing (FOAT)
  • Learn, using the Boltzmann-Arrhenius-Zhurkov (BAZ) constitutive equation, how to predict the probability of failure in the field from the FOAT data

Biography:

Ephraim Suhir is on the faculty of the Portland State University, Portland, OR, USA, Technical University, Vienna, Austria and James Cook University, Queensland, Australia. He is also CEO of a Small Business Innovative Research (SBIR) ERS Co. in Los Altos, CA, USA, is Foreign Full Member (Academician) of the National Academy of Engineering, Ukraine (he was born in that country); Life Fellow of the Institute of Electrical and Electronics Engineers (IEEE), the American Society of Mechanical Engineers (ASME), the Society of Optical Engineers (SPIE), and the International Microelectronics and Packaging Society  (IMAPS);  Fellow of the American Physical Society (APS), the Institute of Physics (IoP), UK, and the Society of Plastics Engineers (SPE); and Associate Fellow of the American Institute of Aeronautics and Astronautics (AIAA).

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