Nanometrology, a branch of metrology specialized in the measurement of structures at the nanoscale, plays a pivotal role in advancing nanotechnology and ensuring the quality and precision of nanomaterials and devices. At this scale, conventional measurement techniques face significant challenges, and nanometrology emerges as a critical discipline to provide accurate, reliable, and traceable measurements. The techniques employed in nanometrology range from state-of-the-art microscopy, such as atomic force microscopy (AFM) and scanning electron microscopy (SEM), to more advanced methods like interferometry and scanning tunneling microscopy (STM). These methodologies allow scientists and engineers to characterize properties such as size, shape, surface roughness, and chemical composition of nanomaterials with unprecedented accuracy. The importance of nanometrology extends across various industries, including electronics, medicine, and materials science. In electronics, for instance, the precise measurement of nanoscale features is crucial for the development of smaller and more efficient semiconductor devices. In medicine, nanometrology facilitates the design and characterization of drug delivery systems and diagnostic tools at the nanoscale.
Ephraim Suhir
Portland State University, United States
Thomas J Webster
Interstellar Therapeutics, United States
Robert Buenker
University of Wuppertal, Germany
Will Skene
Montreal University, Canada
Valeriy A Buryachenko
Micromechanics & Composites LLC, United States
Anis Rahman
Applied Research & Photonics, Inc, United States
Will Skene
Montreal University, Canada
Robert Guidoin
Laval University, Canada
Robert Buenker
University of Wuppertal, Germany
Martin Krus
Fraunhofer Institute for Building Physics, GermanySubmit your abstract Today
Title : Introducing picotechnology: An exciting extension of nanotechnology
Thomas J Webster, Interstellar Therapeutics, United States
Title : The failure of both einsteins space-time theory and his equivalence principle and their resolution by the uniform scaling method
Robert Buenker, University of Wuppertal, Germany
Title : Material challenges with proton conducting ceramics for intermediate temperature hydrogenation/dehydrogenation applications
Saheli Biswas, Commonwealth Scientific and Industrial Research Organisation, Australia
Title : Porphyrin layers at metal-electrolyte interfaces monitored by EC-STM and CV
Marek Nowicki, University of Wroclaw, Poland
Title : Color control of electrochromes by structural modification
Will Skene, Montreal University, Canada
Title : Make experiments more efficient: Two simple and powerful approaches. Mg2Si growth for photovoltaic and thermoelectric applications
Alexander S Gouralnik , Institute of Automation and Control Processes, Russian Federation
Title : Reconfigurable antenna structures using tunable materials
Nasimuddin, Institute for Infocomm Research, Singapore
Title : (0, 1 and 2) Dimensional hybrid architecture of the synthesized materials leads the smart sensing of the gaseous species at low/room temperature
D R Patil, North Maharashtra University, India
Title : Enhanced grain refinement, precipitates regulation, and improved mechanical properties of cast Al-Li alloy by Ti addition and heat treatment
Lixiong Shao, Shanghai Jiao Tong University, China
Title : Broadband sound attenuation of shape memory polymer with triangular-honeycomb unit cell metamaterial structural design
Musaab Ejaz, Universiti Teknologi PETRONAS (UTP), Malaysia