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Scanning Probe Microscopy for Energy Applications

Scanning probe microscopy (SPM) is a broad word that refers to a variety of techniques in which a physical probe is run across a surface and reproduced using piezoelectric actuators. SPM is a technology for generating images of nanoscale structures and surfaces. The imaging is done with light waves, and the interaction power between the surface and the tip is measured. The surface of the material is scanned with a sharp probe set to a few angstroms or nanometers, and three-dimensional topographic images are generated as a result of interactions between the sharp probe and the nanomaterial's surface. SPM (scanning probe microscopy) is a flexible method for probing a variety of material properties. The physical proximity of a probe rastered across the surface of a sample causes changes in parameters in this microscopic method. The physical parameter in the probe could be current, friction, or strain.

Committee Members
Speaker at Materials Science and Engineering 2022 - Ephraim Suhir

Ephraim Suhir

Portland State University, United States
Speaker at Materials Science and Engineering 2022 - Hari Mohan Srivastava

Hari Mohan Srivastava

University of Victoria, Canada
Speaker at Materials Science and Engineering 2022 - Bala Vaidhyanathan

Bala Vaidhyanathan

Loughborough University, United Kingdom
Speaker at Materials Science and Engineering 2022 - Kamran Nikbin

Kamran Nikbin

Imperial College, United Kingdom

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