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Scanning Probe Microscopy for Energy Applications

Scanning probe microscopy (SPM) is a broad word that refers to a variety of techniques in which a physical probe is run across a surface and reproduced using piezoelectric actuators. SPM is a technology for generating images of nanoscale structures and surfaces. The imaging is done with light waves, and the interaction power between the surface and the tip is measured. The surface of the material is scanned with a sharp probe set to a few angstroms or nanometers, and three-dimensional topographic images are generated as a result of interactions between the sharp probe and the nanomaterial's surface. SPM (scanning probe microscopy) is a flexible method for probing a variety of material properties. The physical proximity of a probe rastered across the surface of a sample causes changes in parameters in this microscopic method. The physical parameter in the probe could be current, friction, or strain.

Committee Members
Speaker at Materials Science and Engineering 2023 - Astuty Amrin

Astuty Amrin

Universiti Teknologi, Malaysia
Speaker at Materials Science and Engineering 2023 - Chintakindi Sanjay

Chintakindi Sanjay

King Saud University, Saudi Arabia
Speaker at Materials Science and Engineering 2023 - Zakaria Boumerzoug

Zakaria Boumerzoug

University of Biskra, Algeria
Speaker at Materials Science and Engineering 2023 - Osman Adiguzel

Osman Adiguzel

Firat University, Turkey

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