The name "SPM" refers to a group of surface-sensitive methods, each of which relies on a sharp proximal probe interrogating a particular physical characteristic at the nanometer scale. For instance, the original SPM, the STM, and the AFM detect local surface hardness. A significant advancement in nanoscience, scanning probe microscopy (SPM), has now been applied to a variety of fundamental and practical applications. A paradigm change in how matter is understood and perceived at the nanoscopic and even atomic levels resulted from its application to basic science. SPM physically raster-scans samples and gathers data locally from the surface using a pointy tip. SPM can directly detect a variety of signals in real space with atomic or nanoscale precision, providing a better understanding of the characteristics of the structural, electrical, vibrational, optical, magnetic, (bio)chemical, and mechanical systems. The main ideas and characteristics of SPM and SPM setup and variants are introduced in this primer, with an emphasis on scanning tunnelling microscopy and atomic force microscopy. We provide instructions for SPM experimentation, data analysis, and SPM imaging, spectroscopy, and modification. The most recent uses of SPM in biology, materials science, physics, and chemistry are then emphasised.
Ephraim Suhir
Portland State University, United States
Thomas J Webster
Interstellar Therapeutics, United States
Robert Buenker
University of Wuppertal, Germany
Will Skene
Montreal University, Canada
Valeriy A Buryachenko
Micromechanics & Composites LLC, United States
Anis Rahman
Applied Research & Photonics, Inc, United States
Will Skene
Montreal University, Canada
Robert Guidoin
Laval University, Canada
Robert Buenker
University of Wuppertal, Germany
Martin Krus
Fraunhofer Institute for Building Physics, GermanySubmit your abstract Today
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