An electron microscope called a scanning electron microscope (SEM) scans a sample's surface with a concentrated stream of electrons to create pictures of the material. As the electrons contact with the sample's atoms, different signals emerge that provide details about the sample's surface topography and composition. A raster scan pattern is used to scan the electron beam, and a picture is created by combining the detected signal's strength with the beam's position. Using a secondary electron detector, the most popular SEM mode detects secondary electrons released by atoms stimulated by the electron beam (Everhart–Thornley detector). The specimen topography affects, among other things, the quantity of secondary electrons that may be detected and, consequently, the signal intensity. Some SEMs can provide resolutions that are superior to 1 nm. Specimens are examined at a variety of cryogenic or high temperatures using specialist equipment, as well as in high vacuum in a normal SEM, low vacuum or wet circumstances in a variable pressure or environmental SEM, and both dry and wet conditions in a typical SEM.
Ephraim Suhir
Portland State University, United States
Thomas J Webster
Interstellar Therapeutics, United States
Robert Buenker
University of Wuppertal, Germany
Will Skene
Montreal University, Canada
Valeriy A Buryachenko
Micromechanics & Composites LLC, United States
Anis Rahman
Applied Research & Photonics, Inc, United States
Will Skene
Montreal University, Canada
Robert Guidoin
Laval University, Canada
Robert Buenker
University of Wuppertal, Germany
Martin Krus
Fraunhofer Institute for Building Physics, GermanySubmit your abstract Today
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